MTZ-35
10 µHz – 35 MHz: electrical characterization of materials
- Frequency range 10 µHz – 35 MHz
- DC voltage 100 µV – ±10 V, AC 100 µV – 10 V
- Inductance 10 nH – 10 kH, capacitance 1 pF – 1000 µF, resistance 1 mΩ – 500 MΩ
Application
Materials Characterization and Conductivity
The electrical characterization of ceramics, solid electrolytes, polymers, rubbers, dielectrics, composites, solar cells, semiconductors, biological cells, liquids and electronic components requires impedance measurement over wide frequency and temperature ranges.
Scientific background
The MTZ-35 impedance analyzer measures conductivity, permittivity, dielectric loss and relaxation processes in the 10 µHz – 35 MHz range; MT-Lab® software automates temperature sweeps.
The ITS-e (-40 … 150 °C) and HTF-1100 (150 … 1100 °C) temperature control units provide through-plane and in-plane measurement in a controlled atmosphere with the CESH-e / HTSH-1100 sample holders.
Entek FPP 510 / FPP 630T four point probe systems for sheet resistance; the M470 (SECM, SKP, OSP) for spatially resolved surface conductivity and topography.
Measurement methods used
Impedance spectroscopy (10 µHz – 35 MHz)Temperature-dependent conductivityDielectric spectroscopyFour-point-probe sheet resistanceSECM / SKP surface mapping
Accessories you may need
Instrument by research stage
Recommended products
ITS-e
-40 … +150 °C compact benchtop temperature chamber
- -40 … +150 °C
- Short measurement time thanks to fast cooling
- CESH-e controlled-environment sample holder (up to 2 bar)
HTF-1100 and HTSH-1100
Electrical characterization in a controlled atmosphere up to 1100 °C
- 150 – 1100 °C
- K-type thermocouple, ±1 °C accuracy
- Alumina fibre insulation, emergency stop
FPP 510 — Temperature-Controlled Four Point Probe
Four-point conductivity measurement system combining the probe, measurement electronics and −5…+80 °C temperature control in one portable unit
- All-in-one: probe, controller and temperature control in one portable unit
- PTFE probe head, 4 × 99.9% platinum pins; spacing 1 mm, pin diameter 0.5 mm
- Vertical slide with screw-driven probe arm: from thin films to thick/large samples
FPP 630T — Touch-Screen Four Point Probe
Four-point conductivity measurement for large samples with a touch-screen control panel, 10 mm pin-spacing probe and automatic or manual ranging from 2 MΩ down to 0.05 Ω
- Colour touch-screen control panel: mode, sampling, range, t and K entry on one screen
- PTFE probe head, 4 × 99.9% platinum pins, 10 mm spacing — for large and thick samples; replacement heads available
- Measurement range 2 MΩ → 0.05 Ω: automatic ranging; manual range selection also available
M470
Ultra-high-resolution scanning platform — 9 modular techniques
- 9 techniques: SECM, ac-SECM, ic-SECM, LEIS, SVP (SVET), SDS (SDC), ac-SDS, SKP, OSP
- Positioning resolution 20 nm, scan range 110 mm
- Max. scan speed 10 mm/s; piezo positioning for ic-SECM
VMP-300
The most flexible instrument of the range: 16 configurable channels
- 16 slots: up to 16 independent channels
- Up to 150 A with parallel boosters
- EIS 11 MHz and ULC option per channel
Which configuration for this application?
Let us determine the cell type, current range and channel count together.